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  • Frontiers in Optics 2007/Laser Science XXIII/Organic Materials and Devices for Displays and Energy Conversion
  • OSA Technical Digest (CD) (Optica Publishing Group, 2007),
  • paper JWC8
  • https://doi.org/10.1364/FIO.2007.JWC8

Measurement of Birefringence in Nonlinear Crystals by Interferometry

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Abstract

We present a method to estimate birefringence of wafer-type materials by using Michelson interferometry. The difference between the ordinary and extraordinary refractive indices of a LiNbO3 wafer was determined to an accuracy of 10−3.

© 2007 Optical Society of America

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