Characterizing Dielectric Tensors with Biaxial Ellipsometry

Paula K. Smith; Stephen C. McClain; Russell A. Chipman

doi:10.1364/FIO.2008.FWE8

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper FWE8
•https://doi.org/10.1364/FIO.2008.FWE8

Characterizing Dielectric Tensors with Biaxial Ellipsometry

Paula K. Smith, Stephen C. McClain, and Russell A. Chipman

Frontiers in Optics 2008

Rochester, New York United States
19–23 October 2008
ISBN: 978-1-55752-861-2

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Optically Probed Dynamics in Condensed Matter Systems (FWE)

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P. K. Smith, S. C. McClain, and R. A. Chipman, "Characterizing Dielectric Tensors with Biaxial Ellipsometry," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper FWE8.

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Abstract

Dielectric tensors of liquid crystal polymer retarder films are determined by measuring the sample with an angle-of-incidence Mueller matrix imaging polarimeter. An optimization routine finds the dielectric tensor that best fits the Mueller matrix data.

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