Impact of Surface Roughness on the Effective Dielectric Constant and Subwavelength Image Resolution of Metal-Insulator Stack Lenses

Shivanand; Alon Ludwig; Kevin J. Webb

doi:10.1364/FIO.2011.JTuA11

Frontiers in Optics 2011/Laser Science XXVII
OSA Technical Digest (Optica Publishing Group, 2011),
paper JTuA11
•https://doi.org/10.1364/FIO.2011.JTuA11

Impact of Surface Roughness on the Effective Dielectric Constant and Subwavelength Image Resolution of Metal-Insulator Stack Lenses

Shivanand, Alon Ludwig, and Kevin J. Webb

Frontiers in Optics 2011

San Jose, California United States
16–20 October 2011
ISBN: 978-1-55752-917-6

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FiO/LS Joint Poster Session I (JTuA)

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Shivanand, A. Ludwig, and K. J. Webb, "Impact of Surface Roughness on the Effective Dielectric Constant and Subwavelength Image Resolution of Metal-Insulator Stack Lenses," in Frontiers in Optics 2011/Laser Science XXVII, OSA Technical Digest (Optica Publishing Group, 2011), paper JTuA11.

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Abstract

The effective dielectric constant for a multilayer metal-insulator stack is obtained from a numerical simulation and compared with the analytical result. The impact of the surface roughness for subwavelength imaging is established.

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