Sub-Wavelength Full-Vectorial Profiling of Optical Focus

Hui Yi; Jing Long; Hongquan Li; Xiaolong He; Tian Yang

doi:10.1364/FIO.2013.FW4F.3

Frontiers in Optics 2013
OSA Technical Digest (online) (Optica Publishing Group, 2013),
paper FW4F.3
•https://doi.org/10.1364/FIO.2013.FW4F.3

Sub-Wavelength Full-Vectorial Profiling of Optical Focus

Hui Yi, Jing Long, Hongquan Li, Xiaolong He, and Tian Yang

Frontiers in Optics 2013

Orlando, Florida United States
6–10 October 2013
ISBN: 978-1-55752-987-9

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Unconventional Polarization and Complex Optical Fields III (FW4F)

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H. Yi, J. Long, H. Li, X. He, and T. Yang, "Sub-Wavelength Full-Vectorial Profiling of Optical Focus," in Frontiers in Optics 2013, I. Kang, D. Reitze, N. Alic, and D. Hagan, eds., OSA Technical Digest (online) (Optica Publishing Group, 2013), paper FW4F.3.

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Abstract

The full vectorial electric field profiles of optical focal spots in different polarization states are imaged with a sub-wavelength resolution. The new imaging technique builds upon confocal detection of nanosphere scattering on an aerogel substrate.

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