STED Imaging by Using Hollow Bessel Beam

Wentao Yu; Ziheng Ji; Xusan Yang; Zibo Gong; Yunfeng Xiao; Yunfeng Xiao; Peng Xi; Kebin Shi; Kebin Shi

doi:10.1364/FIO.2015.FTu3D.6

Frontiers in Optics 2015
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper FTu3D.6
•https://doi.org/10.1364/FIO.2015.FTu3D.6

STED Imaging by Using Hollow Bessel Beam

Wentao Yu, Ziheng Ji, Xusan Yang, Zibo Gong, Yunfeng Xiao, Peng Xi, and Kebin Shi

Frontiers in Optics 2015

San Jose, California United States
18–22 October 2015
ISBN: 978-1-943580-03-3

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Microscopy II (FTu3D)

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W. Yu, Z. Ji, X. Yang, Z. Gong, Y. Xiao, P. Xi, and K. Shi, "STED Imaging by Using Hollow Bessel Beam," in Frontiers in Optics 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper FTu3D.6.

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Abstract

We report a STED microscope by using Bessel beam. Improved lateral resolution of deep-imaging at 84μm-depth was observed as 150nm, with comparison to a standard STED imaging resolution of 275nm measured at the same depth.

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