Motion Artefact Detection in Structured Illumination Microscopy

Ronny Förster; Ronny Förster; Kai Wicker; Walter Müller; Walter Müller; Aurélie Jost; Aurélie Jost; Rainer Heintzmann; Rainer Heintzmann

doi:10.1364/FIO.2016.FTh4C.3

Frontiers in Optics 2016
OSA Technical Digest (online) (Optica Publishing Group, 2016),
paper FTh4C.3
•https://doi.org/10.1364/FIO.2016.FTh4C.3

Motion Artefact Detection in Structured Illumination Microscopy

Ronny Förster, Kai Wicker, Walter Müller, Aurélie Jost, and Rainer Heintzmann

Frontiers in Optics 2016

Rochester, New York United States
17–21 October 2016
ISBN: 978-1-943580-19-4

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Computational Imaging I (FTh4C)

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R. Förster, K. Wicker, W. Müller, A. Jost, and R. Heintzmann, "Motion Artefact Detection in Structured Illumination Microscopy," in Frontiers in Optics 2016, OSA Technical Digest (online) (Optica Publishing Group, 2016), paper FTh4C.3.

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Abstract

The necessary image processing in structured illumination microscopy generates high resolution artefacts if the sample has moved during the acquisition. Our algorithm locates motion and distinguishes artefacts from real high resolution cell features.

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