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Time-resolved holographic imaging of femtosecond laser-induced damage process in dielectric thin films

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Abstract

Holographic-microscopy was used to capture dynamics of femtosecond damage process in transparent thin films. Ultrafast amplitude- and phase-contrast movies were recorded and interpreted by numerical simulations of electron dynamics involving Keldysh formalism and multi-rate equations.

© 2016 Optical Society of America

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