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Nonlinear Structured Illumination Microscopy by Employing Saturable Absorbing Material

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Abstract

Nonlinear structured illumination microscopy (SIM) is presented by employing saturable absorbing (SA) material which converts the sinusoidal illumination to a nonlinear pattern. The simulation shows that the effective excitation contains multiple harmonics and provides superior resolution relative to conventional SIM.

© 2022 The Author(s)

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