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Widefield Imaging with Infrared-resonant Third-order Sum-frequency Spectroscopy

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Abstract

An infrared wide-field microscopy based on the infrared-resonant third-order sum-frequency (ITS) process is demonstrated. Video-rate imaging was achieved. The resulting 0.9 µm resolution is much higher than the diffraction limit defined by the input wavelengths.

© 2022 The Author(s)

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