Phase Resolution Measurement in Quantitative Phase Imaging

O. Joseph Ibiyemi; Benjamin Panuski; Shengtao Yu; Pranav P. Kulkarni; Thomas K. Gaylord

doi:10.1364/FIO.2023.JM4A.86

Frontiers in Optics + Laser Science 2023 (FiO, LS)
Technical Digest Series (Optica Publishing Group, 2023),
paper JM4A.86
•https://doi.org/10.1364/FIO.2023.JM4A.86

Phase Resolution Measurement in Quantitative Phase Imaging

O. Joseph Ibiyemi, Benjamin Panuski, Shengtao Yu, Pranav P. Kulkarni, and Thomas K. Gaylord

Frontiers in Optics 2023

Tacoma, Washington United States
9–12 October 2023
ISBN: 978-1-957171-29-6

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Joint Poster Session I and Lunch with Exhibitors (JM4A)

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O. J. Ibiyemi, B. Panuski, S. Yu, P. P. Kulkarni, and T. K. Gaylord, "Phase Resolution Measurement in Quantitative Phase Imaging," in Frontiers in Optics + Laser Science 2023 (FiO, LS), Technical Digest Series (Optica Publishing Group, 2023), paper JM4A.86.

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Abstract

Small-phase-difference mask structures are fabricated and tested to estimate the phase resolution measurable in quantitative phase imaging.

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