Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications

Manal Khreishi; Manal Khreishi; Raymond Ohl; Joseph Howard; Jonathan Papa; Clark Hovis; Andrew Howe; Theodore Hadjimichael; Patrick Thompson; Ron Shiri; Garrett West; Adam Phenis; Rongguang Liang

doi:10.1364/FREEFORM.2019.FM4B.6

Optical Design and Fabrication 2019 (Freeform, OFT)
OSA Technical Digest (Optica Publishing Group, 2019),
paper FM4B.6
•https://doi.org/10.1364/FREEFORM.2019.FM4B.6

Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications

Manal Khreishi, Raymond Ohl, Joseph Howard, Jonathan Papa, Clark Hovis, Andrew Howe, Theodore Hadjimichael, Patrick Thompson, Ron Shiri, Garrett West, Adam Phenis, and Rongguang Liang

Freeform Optics 2019

Washington, DC United States
10–12 June 2019
ISBN: 978-1-943580-60-6

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Freeform in Space Applications (FM4B)

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M. Khreishi, R. Ohl, J. Howard, J. Papa, C. Hovis, A. Howe, T. Hadjimichael, P. Thompson, R. Shiri, G. West, A. Phenis, and R. Liang, "Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications," in Optical Design and Fabrication 2019 (Freeform, OFT), OSA Technical Digest (Optica Publishing Group, 2019), paper FM4B.6.

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Abstract

CMM metrology provides simple, 3D surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.

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