Abstract

A mathematical model has been developed that describes the silicon composition gradient produced in germanium-silicon alloy crystals which have been formed via Czochralski crystal growing. This model is based on the naturally occuring segregation effect of silicon in germanium. In addition the refractive index of the alloy is described in terms of its relation to the band gap energy, which is itself dependent on the silicon concentration. A relationship between refractive index and the silicon compositon of the alloy is then derived.

© 1987 Optical Society of America