Abstract

Many integrated-optics devices are equipped with electrical contacts that serve the purpose of applying an electric field to an optical waveguide that exists at some distance beneath the surface of the dielectric material. Proper design of such structures requires that the electric field generated by the contacts be known. If the dielectric material is homogeneous, solution of the electrostatic field problem is often possible by means of a conformal mapping. However, if the dielectric structure consists of stratified layers, conformal mapping is not useful for simplifying the problem and other means must be found for computing the electrostatic potential ψ underneath the contacts.

© 1989 Optical Society of America