We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)π-mm-mrad.

© 2016 Optical Society of America

PDF Article
More Like This
Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton-scattered x-rays

G. Golovin, S. Banerjee, C. Liu, S. Chen, J. Zhang, B. Zhao, P. Zhang, M. Veale, M. Wilson, P. Seller, and D. Umstadter
FTu1C.3 Frontiers in Optics (FiO) 2016

X-ray generation via laser Compton scattering using electron beam driven by laser-plasma acceleration

Eisuke Miura, Ryunosuke Kuroda, and Hiroyuki Toyokawa
FTh2A.1 Frontiers in Optics (FiO) 2013

All-laser-driven Compton x-ray light source

Donald Umstadter
ET2A.2 Compact EUV & X-ray Light Sources (EUVXRAY) 2016


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access Optica Member Subscription