Abstract

We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)π-mm-mrad.

© 2016 Optical Society of America

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