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Increase of Carrier-Envelope Phase Noise in Water and Cryogenically Cooled Ti:Sapphire Amplifiers

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Abstract

CEP drift of ultrashort pulses originating solely from an amplifier is measured. The CEP noise in water cooled amplifiers has thermal origin, while it is induced by the inherent vibration of Ti:Sa upon cryogenical cooling.

© 2016 Optical Society of America

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