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XUV Reflection and Ellipsometry Experiments at ELIBeamlines

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Abstract

We report on the results of the recent experiments of the XUV ELIps reflection and ellipsometry station at ELI Beamlines. Using the High Harmonic Generation source and a 1 kHz in-house developed laser, experiments in known samples such as GaN, STO and SiC were done and will be discussed.

© 2020 The Author(s)

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