Nonlinear Thomson Scattering: a Tool for Assessing Relativistic Intensities and Beyond

C. He; C. He; C. He; A. Longman; J. I. A. Aginako; J. A. Pérez-Hernández; R. Fedosejevs; L. Roso; W. T. Hill; W. T. Hill; W. T. Hill

doi:10.1364/EUVXRAY.2020.JW4A.2

OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS)
OSA Technical Digest (Optica Publishing Group, 2020),
paper JW4A.2
•https://doi.org/10.1364/EUVXRAY.2020.JW4A.2

Nonlinear Thomson Scattering: a Tool for Assessing Relativistic Intensities and Beyond

C. He, A. Longman, J. I. A. Aginako, J. A. Pérez-Hernández, R. Fedosejevs, L. Roso, and W. T. Hill

High Intensity Lasers and High Field Phenomena 2020

Washington, DC United States
16–20 November 2020
ISBN: 978-1-943580-73-6

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Joint Postdeadline Paper Session (JW4A)

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C. He, A. Longman, J. I. A. Aginako, J. A. Pérez-Hernández, R. Fedosejevs, L. Roso, and W. T. Hill, "Nonlinear Thomson Scattering: a Tool for Assessing Relativistic Intensities and Beyond," in OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), L. Assoufid, P. Naulleau, M. Couprie, T. Ishikawa, J. Rocca, C. Haefner, G. Sansone, T. Metzger, F. Quéré, M. Ebrahim-Zadeh, A. Helmy, F. Laurell, and G. Leo, eds., OSA Technical Digest (Optica Publishing Group, 2020), paper JW4A.2.

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Abstract

Elements of an in situ gauge exploiting relativistic Thomson scattering for measuring intensities from 10¹⁸ to 10²⁵ W/cm² and expelling electrons and protons from the focal volume will be presented.

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