Holographic Interferometry Methods for Conducting Stress Analysis on Quartz Crystal Components

Jill A. Brosig

doi:10.1364/DOMO.1996.JTuB.24

Holography
Technical Digest Series (Optica Publishing Group, 1996),
paper JTuB.24
•https://doi.org/10.1364/DOMO.1996.JTuB.24

Holographic Interferometry Methods for Conducting Stress Analysis on Quartz Crystal Components

Jill A. Brosig

Holography 1996

Massachusetts United States
29–30 April 1996
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J. A. Brosig, "Holographic Interferometry Methods for Conducting Stress Analysis on Quartz Crystal Components," in Holography, Technical Digest Series (Optica Publishing Group, 1996), paper JTuB.24.

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Abstract

The technique of holographic interferometry has aided in Motorola’s Quartz Products Division’s continuous pursuit of higher quality quartz crystal components. QPD’s portfolio consists of several models of quartz crystals, which are sold as resonators, oscillators, and filters. The crystal frequency for the various products ranges from 12 MHz to 100 MHz.

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