True 3-D Transmission Electron Microscopy

Alan Caril Nelson

doi:10.1364/IACT.1984.MC6

Topical Meeting on Industrial Applications of Computed Tomography and NMR Imaging
Technical Digest Series (Optica Publishing Group, 1984),
paper MC6
•https://doi.org/10.1364/IACT.1984.MC6

True 3-D Transmission Electron Microscopy

Alan Caril Nelson

Industrial Applications of Computed tomography and NMR Imaging 1984

Hecla Island, Manitoba Canada
13–14 August 1984
ISBN:

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Session III (MC)

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A. C. Nelson, "True 3-D Transmission Electron Microscopy," in Topical Meeting on Industrial Applications of Computed Tomography and NMR Imaging, Technical Digest Series (Optica Publishing Group, 1984), paper MC6.

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Abstract

A transmission electron microscope operating in the 100kV range has been designed to perform three dimensional analysis of relatively thick specimens. Specimens can be up to 8mm in diameter and over one micrometer thick, so that the third dimension is useful at sub-micron resolutions. We call our technique microtomography.

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