Abstract
Ultrasensitive operationally easy, on-line analytical techniques are required to monitor the fabrication and processing of ultrahigh purity electronic materials. Where inert atmospheres free of oxygen and carbon contamination are required, metastable transfer emission spectroscopy (MTES) is suited ideally for continuous monitoring of gas purity.
© 1984 Optical Society of America
PDF ArticleMore Like This
H. Kett and W. Gebhardt
ThD1 International Conference on Luminescence (ICOL) 1984
S. J. Berens, J. Scheele, W. L. Butler, and D. Magde
ThE5 International Conference on Ultrafast Phenomena (UP) 1984
A.J. Campillo, L.S. Goldberg, and P.E. Schoen
TuE3 International Conference on Ultrafast Phenomena (UP) 1984