Abstract
Photoelectron Diffraction is a powerful method to monitor the atomic structure of surfaces. From the chosen emitter site in a sample the photoelectron moves out as wave that is then coherently scattered by the neighboring atoms. The directly emitted and the scattered waves create interference fringes in the detector plane. Especially for higher electron energies the scatterers show a highly peaked scattering cross-section in the forward direction. This forward focusing (see Fig. 1) allows to directly read emitter-scatterer directions from the measurments. Thus by scanning the half space above the sample with the detector, a 2-D data set is recorded that gives structural information about the examined system. (see Fig. 2) This information can be for instance the angles between emitter and the neigbouring atoms, the azimuthal orientation of the substrate on surfaces, the spacing Fingerprint of molecular orientation between adsorbates and substrate or even the bond length of neighbouring atoms. [1][4]
© 2012 Optical Society of America
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