Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Method of Specifying High Quality Optical Systems

Not Accessible

Your library or personal account may give you access

Abstract

For optical systems which are near diffraction limited, the Strehl ratio (SR) is a unique number, which links between the residual wavefront aberrations to the diffraction image of a point source. The Strehl ratio is related to the variance of the wavefront. In the present model, the different geometrical aberrations are computed to define their contribution to the Strehl value, which is employed as a merit function in the system specification. This criteria enables system evaluation (either by MTF analysis, geometrical spot and Point Spread Functions) prior to system design.

© 1998 Optical Society of America

PDF Article
More Like This
Aberration polynomial fitting and MTF based optimization for general optical systems

Yongtian Wang, Xingui Tang, and Lin Li
LMC.4 International Optical Design Conference (IODC) 1998

Evaluation of Highly Corrected Optics by Measurement of the Strehl Ratio

Norman Bobroff and Alan E. Rosenbluth
OWA3 Optical Fabrication and Testing (OF&T) 1990

Optical material model statistical quality-of-fit evaluation method

Ronald J. Komiski
LTuC.6 International Optical Design Conference (IODC) 1998

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.