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Conferences > IPR > 1992 > MB > MB16

Analysis of Electrooptic Device Electrcodes: Influence of Metalization Thickness, Substrate Optical Axis Inclination and Buffer Layer

Marat Davidovitz, Zhiqiang Wu, and Anand Gopinath

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Abstract

Characterization of the transmission line properties of electrooptic modulators has received considerable attention in recent years. Various analytical and numerical approaches have been applied to solve the boundary value problems involving strip lines on anisotropic substrates [1, 2, 3, 4, 5, 6]. In many cases the effects of the electrode thickness and the general nature of the substrate anisotropy were not considered.

© 1992 Optical Society of America

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