Photo-Effects in SiO2/GeO2 Waveguides

N. F. Borrelli; R. A. Modavis; J. W. H. Schreurs

doi:10.1364/IPR.1992.WG4

Integrated Photonics Research
1992 OSA Technical Digest Series (Optica Publishing Group, 1992),
paper WG4
•https://doi.org/10.1364/IPR.1992.WG4

Photo-Effects in SiO₂/GeO₂ Waveguides

N. F. Borrelli, R. A. Modavis, and J. W. H. Schreurs

Integrated Photonics Research 1992

New Orleans, Louisiana United States
ISBN: 1-55752-232-4

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N. F. Borrelli, R. A. Modavis, and J. W. H. Schreurs, "Photo-Effects in SiO2/GeO2 Waveguides," in Integrated Photonics Research, Vol. 10 of 1992 OSA Technical Digest Series (Optica Publishing Group, 1992), paper WG4.

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Abstract

The so-called photorefractive effect in SiO₂/GeO₂ waveguide materials¹ is initiated by exposure to ultaviolet radiation in the vicinity of 240nm. Absorption changes produced by this exposure contribute to a refractive index change at longer wavelengths, which can have device implications₂ e.g., writing Bragg gratings in single-mode fibers for filters.

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