Individual Addressing Closely-Spaced Solid-State Defect Qubits with Microsphere-Assisted Microscopy

Jong Sung Moon; Haneul Lee; Jin Hee Lee; Woong Bae Jeon; Dowon Lee; Junghyun Lee; Seoyoung Paik; Seoyoung Paik; Sang-Wook Han; Rolf Reuter; Andrej Denisenko; Jörg Wrachtrup; Sang-Yun Lee; Sang-Yun Lee; Je-Hyung Kim

doi:10.1364/IPRSN.2022.ITu1B.4

Optica Advanced Photonics Congress 2022
Technical Digest Series (Optica Publishing Group, 2022),
paper ITu1B.4
•https://doi.org/10.1364/IPRSN.2022.ITu1B.4

Individual Addressing Closely-Spaced Solid-State Defect Qubits with Microsphere-Assisted Microscopy

Jong Sung Moon, Haneul Lee, Jin Hee Lee, Woong Bae Jeon, Dowon Lee, Junghyun Lee, Seoyoung Paik, Sang-Wook Han, Rolf Reuter, Andrej Denisenko, Jörg Wrachtrup, Sang-Yun Lee, and Je-Hyung Kim

Integrated Photonics Research, Silicon and Nanophotonics 2022

Maastricht,Limburg Netherlands
24–28 July 2022
ISBN: 978-1-957171-16-6

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Photonic Imaging and Waveguides (ITu1B)

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J. S. Moon, H. Lee, J. H. Lee, W. B. Jeon, D. Lee, J. Lee, S. Paik, S. Han, R. Reuter, A. Denisenko, J. Wrachtrup, S. Lee, and J. Kim, "Individual Addressing Closely-Spaced Solid-State Defect Qubits with Microsphere-Assisted Microscopy," in Optica Advanced Photonics Congress 2022, Technical Digest Series (Optica Publishing Group, 2022), paper ITu1B.4.

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Abstract

By implementing microsphere-assisted confocal microscopy, we introduce a high-resolution and contrast optical interface for solid-state defect qubits. We can address single photon as well as single spin from neighboring two defects individually.

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