Abstract
Recently, we developed a novel technique to measure the degenerate third-order nonlinear susceptibility χ(3) (ω, ω, ω) for both thin-film and bulk nonlinear materials. The technique utilizes the change of mode dispersion with optical intensity that is due to the presence of χ(3) In the case of thin-film materials where waveguide modes exist, the nonlinear waveguide modes were used for the measurement. In the cases of thin-film materials where waveguide modes do not exist in the wavelength region of interest, or for bulk materials, a metal is coated on one interface and the nonlinear surface plasmons modes were used. One can couple to both waveguide modes and surface plasmon modes via either a prism or a grating using conventional attenuated total reflection (ATR) techniques.
© 1984 Optical Society of America
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