Inverse hook method for measuring oscillator strengths

W. A. VAN WIJNGAARDEN; KEITH D. BONIN; W. HAPPER; E. MIRON; D. SCHREIBER; T. ARISAWA

International Quantum Electronics Conference
OSA Technical Digest (Optica Publishing Group, 1986),
paper FII1

Inverse hook method for measuring oscillator strengths

W. A. VAN WIJNGAARDEN, KEITH D. BONIN, W. HAPPER, E. MIRON, D. SCHREIBER, and T. ARISAWA

International Quantum Electronics Conference 1986

San Francisco, California United States
9–13 June 1986
ISBN: 0-936659-11-4

From the session
Novel Optical measurements (FII)

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W. A. VAN WIJNGAARDEN, K. D. BONIN, W. HAPPER, E. MIRON, D. SCHREIBER, and T. ARISAWA, "Inverse hook method for measuring oscillator strengths," in International Quantum Electronics Conference, M. Richardson, C. Tang, D. Grischkowsky, and T. Hansch, eds., OSA Technical Digest (Optica Publishing Group, 1986), paper FII1.

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Abstract

We describe a new method for measuring absolute oscillator strengths for transitions between excited states. The new method is closely analogous to the classical hook method.

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