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Optica Publishing Group
  • XVIII International Quantum Electronics Conference
  • Technical Digest Series (Optica Publishing Group, 1992),
  • paper PTh118

A Triangulation Based Microtopography System

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Abstract

As consumers exigence and competition grows the industrial companies require more reliable, accurate and versatile surface inspection systems to be developed. Fabrics thickness measurements where usualy made by means of contact probes that deformed the samples leading to the necessity of complicate correction procedures. We have developed an optical system of non contact microtopography based on a simple principle if triangulation, devoted to measure thickness and relief mapping of fabrics.

© 1992 IQEC

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