Optical Characterization of Nanoscale Features

K. J. Strozewski; G. C. Wetsel

XVIII International Quantum Electronics Conference
Technical Digest Series (Optica Publishing Group, 1992),
paper PWe085

Optical Characterization of Nanoscale Features

K. J. Strozewski and G. C. Wetsel

International Quantum Electronics Conference 1992

Vienna Austria
14–19 June 1992
ISBN:

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Poster Session II (PWe)

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K. J. Strozewski and G. C. Wetsel, "Optical Characterization of Nanoscale Features," in XVIII International Quantum Electronics Conference, Technical Digest Series (Optica Publishing Group, 1992), paper PWe085.

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Abstract

A scanned nanoprobe instrument (SNI), based on scanning-tuneling-microscope (STM) technology, has been developed at UTD for the purpose of nanoscale material modification and characterization.^[1] Using the SNI guided by a novel optical viewing system, the first high-resolution STM images of quantum dots at identifiable locations were obtained.^[2] In addition to imaging, the SNI can measure electrical and optical characteristics of individual quantum devices.

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