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  • International Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 1998),
  • paper QFF2

Near-field optical second-harmonic microscopy

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Abstract

Until recently, second-harmonic generation (SHG) from surfaces has been studied only in the far-field region. The first implementation of near-field optical techniques in SHG studies has been reported recently.1,2 SH imaging of rough metal surfaces, piezoelectric, and ferromagnetic materials with 150-nm resolution has been demonstrated. The high spatial resolution of near-field SH microscopy may allow it to become a new surface characterization technique complementary to magnetic-force and electric-force microscopies.

© 1998 Optical Society of America

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