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Conferences > IQEC > 2009 > JTuD > JTuD16
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper JTuD16
  • •https://doi.org/10.1364/CLEO.2009.JTuD16

Failure Mode Investigation of High Power Multi-Mode InGaAs-AlGaAs Strained Quantum Well Lasers using Time-Resolved EL and EBIC Techniques

Yongkun Sin, Neil Ives, Nathan Presser, and Steven C. Moss

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Abstract

We report our failure mode investigation of high power multi-mode InGaAs-AlGaAs strained quantum well (QW) lasers using time-resolved electroluminescence (EL) and electron beam induced current (EBIC) techniques.

© 2009 Optical Society of America

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