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High resolution tomographic phase microscopy

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Abstract

Topographic phase microscopy reconstructs 3D phase image based on measurement of projections of refractive index in multiple directions and the resolution of the 3D phase image is determined by the accuracy of the quantitative phase detection. We proposed a beam rotation Mach-Zehnder heterodyne interferometer phase detection microscopy. In this system, the sample arm and the reference arm rotated at same frequency, phase and amplitude, so the phase detection even at oblique angle has the same accuracy with that at the vertical angle. Then the reconstruct 3D image has higher resolution and signal noise ratio.

© 2016 Optical Society of America

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