Considerations for Two Beam Interference on Excitation and Emission Light Paths for Structured Illumination Microscopy

Qinggele Li; Alex Bardales; Xiaodong Tao; Marc Reinig; Joel Kubby

doi:10.1364/ISA.2017.ITh1E.5

Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP)
OSA Technical Digest (online) (Optica Publishing Group, 2017),
paper ITh1E.5
•https://doi.org/10.1364/ISA.2017.ITh1E.5

Considerations for Two Beam Interference on Excitation and Emission Light Paths for Structured Illumination Microscopy

Qinggele Li, Alex Bardales, Xiaodong Tao, Marc Reinig, and Joel Kubby

Imaging Systems and Applications 2017

San Francisco, California United States
26–29 June 2017
ISBN: 978-1-943580-29-3

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Novel Methods in Microscopy (ITh1E)

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Q. Li, A. Bardales, X. Tao, M. Reinig, and J. Kubby, "Considerations for Two Beam Interference on Excitation and Emission Light Paths for Structured Illumination Microscopy," in Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP), OSA Technical Digest (online) (Optica Publishing Group, 2017), paper ITh1E.5.

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Abstract

The use of adaptive optics correction for structured illumination microscopy requires spatial sinusoid patterns in the sample obtained via two beam interference. We simulate the effect of AO correction on both excitation and emission paths, and propose a better SIM microscope based that considers the special requirements for SIM.

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