Ultramicrotoming of Phase-Change Optical Disks for Cross-Sectional Transmission Electron Microscopy

Myong R. Kim; Jeong W. Park; Jeong S. Lee

doi:10.1364/ISOM.1996.OTuB.11

Joint International Symposium on Optical Memory and Optical Data Storage
Technical Digest Series (Optica Publishing Group, 1996),
paper OTuB.11
•https://doi.org/10.1364/ISOM.1996.OTuB.11

Ultramicrotoming of Phase-Change Optical Disks for Cross-Sectional Transmission Electron Microscopy

Myong R. Kim, Jeong W. Park, and Jeong S. Lee

Symposium on Optical Memory 1996

Hawaii United States
8–12 July 1996
ISBN:

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ISOM/ODS Poster Session (OTuB)

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M. R. Kim, J. W. Park, and J. S. Lee, "Ultramicrotoming of Phase-Change Optical Disks for Cross-Sectional Transmission Electron Microscopy," in Joint International Symposium on Optical Memory and Optical Data Storage, Technical Digest Series (Optica Publishing Group, 1996), paper OTuB.11.

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Abstract

Ultramicrotomy for the preparation of cross-sectional TEM thin foils of phase-change optical disks and analytical electron microscopy were carried out to examine detailed microstructural features.

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