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Fast vector diffraction calculation for embossed optical disks with arbitrary profiles

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Abstract

In the development of future higher density optical disks, it is quite important to determine quickly how the reconstructed signals change according to incident light polarization conditions and the profile shape of the optical disks. Current methods of vector diffraction calculation1-4) for this purpose, however, seem to be possible only when there are several restrictions, such as rectangular profile1-3), one-dimensional profile1), perfect conductive material1-3) or long computation time4). We have tried to offer a solution to this problem in this paper.

© 1996 Optical Society of America

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