Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk systems

Not Accessible

Your library or personal account may give you access

Abstract

Currently, phase change materials are used in optical recording such as Blu-ray and DVD disk systems. Marks on the phase change recording layer of the optical disk are created at the parts that are heated by a recording optical beam and also are quickly cooled by a heat sink layer adjacent to the recording layer. Therefore, the edges of the recorded marks may be sifted that are inhibitory agent for high-density optical recording. It is required to achieve high-density optical disk systems that information marks are precisely recorded on the recording layer of the optical disk. The effects of the mark edge shifted linearly can be easily adjusted by using write and readout compensations. However, it is difficult to adjust the effects of the mark edge nonlinearly shifted.1)-2) Therefore, the method is desired that the amounts of nonlinear mark edge shift are measured quantitatively.

© 2011 Optical Society of America

PDF Article
More Like This
High Density Mark Edge Recoding on a Phase Change Rewritable Disk by a 680nm Laser Diode

Takashi Ishida, Mamoru Shoji, Yoshiyuki Miyabata, Yasumasa Shibata, Eiji Ohno, and Shunji Ohara
TuC5 Optical Data Storage (ODS) 1994

Time Resolving Analysis of Amorphous Mark Forming in Phase Change Optical Disks

Hidehiko Kando, Takeshi Maeda, Motoyasu Terao, Makoto Miyamoto, Akemi Hirotsune, and Hideo Ohnuki
MC.4 Optical Data Storage (ODS) 1998

Initialization-free Multi-speed Phase-change Optical Disk

X. S. Miao, L. P. Shi, P. K. Tan, X. Hu, H. B. Yao, J. M. Li, and T. C. Chong
TuE29 Optical Data Storage (ODS) 2003

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved