High resolution imaging by electron-beam excitation assisted optical microscope with emission layer for a brighter nanometric light source

Y. Masuda; Y. Nawa; C. Morita; M. Kamiya; W. Inami; W. Inami; A. Miyake; A. Miyake; A. Sugita; Y. Kawata; Y. Kawata; Y. Nakanishi

doi:10.1364/JSAP.2013.17a_D4_1

JSAP-OSA Joint Symposia 2013 Abstracts
(Optica Publishing Group, 2013),
paper 17a_D4_1
•https://doi.org/10.1364/JSAP.2013.17a_D4_1

High resolution imaging by electron-beam excitation assisted optical microscope with emission layer for a brighter nanometric light source

Y. Masuda, Y. Nawa, C. Morita, M. Kamiya, W. Inami, A. Miyake, A. Sugita, Y. Kawata, and Y. Nakanishi

JSAP-OSA Joint Symposia 2013

Kyoto Japan
16–20 September 2013
ISBN: 978-4-86348-369-9

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Medical Photonics (17a_D4)

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Y. Masuda, Y. Nawa, C. Morita, M. Kamiya, W. Inami, A. Miyake, A. Sugita, Y. Kawata, and Y. Nakanishi, "High resolution imaging by electron-beam excitation assisted optical microscope with emission layer for a brighter nanometric light source," in JSAP-OSA Joint Symposia 2013 Abstracts, (Optica Publishing Group, 2013), paper 17a_D4_1.

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Abstract

Observations of biological specimens in nanometer range are one of the most promising techniques to improve nano-science and bioscience. We have developed an electron-beam excitation assisted (EXA) optical microscope [1] which has a few tens nanometer spatial resolution laterally in various surroundings like air or liquids. With an EXA microscope, we can observe optical constants like absorptions, refractive indexes, polarization properties, and their dynamic behaviors in nanometer scale.

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