Abstract

Tip-enhanced Raman scattering (TERS) microscopy is one of most successful applications of plasmonics to nano-imaging and nano-analysis of a variety of advanced nanomaterials. TERS microscopy employs a metallic nano-tip which plays important roles in confining and enhancing the probing light field due to the excitation of localized modes of surface plasmon polaritons (SPP) at the apex [1, 2]. Combination of a scanning SPP tip with Raman spectroscopy has so far enabled us to perform analytical nano-imaging of nano-carbon materials as well as semiconductors and biomolecules with spatial resolution far beyond the classical diffraction limit [3-7].

© 2014 Japan Society of Applied Physics, Optical Society of America