Atomic Vapor Density Monitor*

N. Sewall; W. Harris; R. Beeler; J. Wooldridge; H. Chen

doi:10.1364/LACA.1987.WA5

Topical Meeting on Laser Applications to Chemical Analysis
Technical Digest Series (Optica Publishing Group, 1987),
paper WA5
•https://doi.org/10.1364/LACA.1987.WA5

Atomic Vapor Density Monitor^*

N. Sewall, W. Harris, R. Beeler, J. Wooldridge, and H. Chen

Laser Applications to Chemical Analysis 1987

Incline Village, Nevada United States
26–29 January 1987
ISBN:

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Session 5 (WA)

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N. Sewall, W. Harris, R. Beeler, J. Wooldridge, and H. Chen, "Atomic Vapor Density Monitor*," in Topical Meeting on Laser Applications to Chemical Analysis, Technical Digest Series (Optica Publishing Group, 1987), paper WA5.

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Abstract

The atomic vapor density monitor (AVDM) system measures absorption of light from a swept-wavelength laser that passes through an atomic vapor stream. This vapor stream is above the surface of a crucible-contained melt in an atomic-vapor generator.

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