Abstract
The technique of Frequency Modulation (FM) and Wavelength Modulation Spectroscopy has been used [1] very successfully recently to perform several different types of measurements, with the applications of this technique growing as advances in semiconductor technology result in the availability of reliable, tunable single-mode semiconductor diode lasers in parts of the electromagnetic spectrum which were previously inaccessible this way.
© 1994 Optical Society of America
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