Diode Laser Based Film Thickness Measurement of DEF

Anna Schmidt; Anna Schmidt; Benjamin Kühnreich; Benjamin Kühnreich; Hannah Kittel; Cameron Tropea; Ilia V. Roisman; Andreas Dreizler; Steven Wagner; Steven Wagner

doi:10.1364/LACSEA.2018.LM3C.3

Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP)
OSA Technical Digest (Optica Publishing Group, 2018),
paper LM3C.3
•https://doi.org/10.1364/LACSEA.2018.LM3C.3

Diode Laser Based Film Thickness Measurement of DEF

Anna Schmidt, Benjamin Kühnreich, Hannah Kittel, Cameron Tropea, Ilia V. Roisman, Andreas Dreizler, and Steven Wagner

Laser Applications to Chemical, Security and Environmental Analysis 2018

Orlando, Florida United States
25–28 June 2018
ISBN: 978-1-943580-44-6

From the session
Novel Techniques & Special Applications (LM3C)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
A. Schmidt, B. Kühnreich, H. Kittel, C. Tropea, I. V. Roisman, A. Dreizler, and S. Wagner, "Diode Laser Based Film Thickness Measurement of DEF," in Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP), OSA Technical Digest (Optica Publishing Group, 2018), paper LM3C.3.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

An absorption based laser sensor for the investigation of liquid film thicknesses of DEF is presented. A wavelength pre-selection ensures that film thicknesses could be measured without cross sensitivity to temperature or concentration.

PDF Article

More Like This

Diode Laser-based Film Thickness Measurement of DEF in a generic exhaust gas test bench for the investigation of SCR-relevant processes

Anna Schmidt, Benjamin Kühnreich, Matthias Jacobs, and Steven Wagner
ATh4K.4 CLEO: Applications and Technology (CLEO:A&T) 2019

Measurements of Liquid Film Thickness by Tracer LIF, Raman Scattering and Diode Laser Absorption Spectroscopy

D. Greszik, H. Yang, T. Dreier, and C. Schulz
LWA6 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2010

DLAS-based measurement of water film thickness in retro-reflection

R. Pan, C. Brocksieper, J.B. Jeffries, T. Dreier, and C. Schulz
JW1F.4 3D Image Acquisition and Display: Technology, Perception and Applications (3D) 2016

Previous Article Next Article