Monitoring of thermally driven drying varnish kinetics

Pedro Zambianchi; Marlos de Oliveira Ribas; Fernanda Mantuan Dala Rosa de Oliveira; Fernando Antonio Moura Saccon; José Luís Fabris; Marcia Muller

doi:10.1364/LAOP.2012.LT2A.13

Latin America Optics and Photonics Conference
OSA Technical Digest (online) (Optica Publishing Group, 2012),
paper LT2A.13
•https://doi.org/10.1364/LAOP.2012.LT2A.13

Monitoring of thermally driven drying varnish kinetics

Pedro Zambianchi, Marlos de Oliveira Ribas, Fernanda Mantuan Dala Rosa de Oliveira, Fernando Antonio Moura Saccon, José Luís Fabris, and Marcia Muller

Latin America Optics and Photonics Conference 2012

Sao Sebastiao Brazil
10–13 November 2012
ISBN: 978-1-55752-9589

From the session
Poster Session 2 (LT2A)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
P. Zambianchi, M. de Oliveira Ribas, F. M. D. R. de Oliveira, F. A. M. Saccon, J. L. Fabris, and M. Muller, "Monitoring of thermally driven drying varnish kinetics," in Latin America Optics and Photonics Conference, OSA Technical Digest (online) (Optica Publishing Group, 2012), paper LT2A.13.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Time dependence of solvent mass loss taking place in drying varnish kinetics is investigated. A simplified theoretical model based on Fick’s law is presented and its relation to actual polymer drying diffusion process is discussed.

PDF Article

More Like This

Monitoring of Paint Drying Process by Phase-shifting Digital Holography

Ichirou Yamaguchi, Takasi Ida, Masayuki Yokota, and Koichi Kobayashi
DWC2 Digital Holography and Three-Dimensional Imaging (DH) 2007

Paint Drying Process Monitored by Digital Holography and Estimation of Tack-free Time

Masayuki Yokota, Tomoaki Kawakami, and Yoshiki Kimoto
DTuC38 Digital Holography and Three-Dimensional Imaging (DH) 2011

Watching paint dry and other exciting processes monitored by thin-film-interferometry

John E. Saunders, Hao Chen, Connor Sanders, Chris Brauer, McGregor Clayton, Jack A. Barnes, and Hans-Peter Loock
AITh4A.2 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2016

Previous Article Next Article