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Microcontroller-based nanothermometer with a single nitrogen-vacancy defect in a nanodiamond

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Abstract

In this work, the characterization of single nitrogen-vacancy (NV-) defects in nanodiamonds as luminescent nanothermometers is performed. A microcontroller-based system is used to monitor the temperature of a sample using a nanothermometer, reinforcing the multisensing capability of the NV-.

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