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Conferences > LAOP > 2022 > W4A > W4A.16

Focusing System Based on Two-Photon Absorption in a Si-detector

J. Delgado-Aguillón, C. Ruíz, M. Rosete-Aguilar, C. J. Román-Moreno, and J. Graduño-Mejía

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Abstract

We introduce a novel technique for the focal spot location based on Two-Photon Absorption effect, measured with a Si detector along the optical axis. A focus location was performed at 1550 nm with an error of ± 5 µm.

© 2022 The Author(s)

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