Nanoscale mapping using AFM and KPFM in Er/Yb:BaTiO3 films to photonics applications

J. L. Clabel H.; E. Marega

doi:10.1364/LAOP.2022.W4A.50

Latin America Optics and Photonics (LAOP) Conference 2022
Technical Digest Series (Optica Publishing Group, 2022),
paper W4A.50
•https://doi.org/10.1364/LAOP.2022.W4A.50

Nanoscale mapping using AFM and KPFM in Er/Yb:BaTiO₃ films to photonics applications

J. L. Clabel H. and E. Marega

Latin America Optics and Photonics Conference 2022

Recife Brazil
7–11 August 2022
ISBN: 978-1-957171-13-5

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Joint Poster Session II (W4A)

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J. L. Clabel H. and E. Marega, "Nanoscale mapping using AFM and KPFM in Er/Yb:BaTiO3 films to photonics applications," in Latin America Optics and Photonics (LAOP) Conference 2022, Technical Digest Series (Optica Publishing Group, 2022), paper W4A.50.

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Abstract

The functionalization of advanced materials for photonics devices is dependent on nanoscale mapping. Technique AFM and KPFM were used to investigate the surface evolution and quantitative information is discussed.

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