Chiroptical Imaging of Crystals by Mueller Matrix Microscopy

John Freundenthal; John Freundenthal; Erica Gunn; Bart Kahr; Bart Kahr

doi:10.1364/LS.2009.LSMF1

Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest
OSA Technical Digest (CD) (Optica Publishing Group, 2009),
paper LSMF1
•https://doi.org/10.1364/LS.2009.LSMF1

Chiroptical Imaging of Crystals by Mueller Matrix Microscopy

John Freundenthal, Erica Gunn, and Bart Kahr

Laser Science 2009

San Jose, California United States
11–15 October 2009
ISBN: 978-1-55752-878-0

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Advances in Chiroptical Spectroscopy II (LSMF)

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J. Freundenthal, E. Gunn, and B. Kahr, "Chiroptical Imaging of Crystals by Mueller Matrix Microscopy," in Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest, OSA Technical Digest (CD) (Optica Publishing Group, 2009), paper LSMF1.

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Abstract

Mueller matrix microscopy is evaluated as a tool for characterizing the heterogeneities and anisotropies of chiroptical properties of crystalline and polycrystalline materials.

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