Precision Metrology with a Strontium Ion Interferometer

Christopher J. Erickson; James L. Archibald; Mary Lyon; Dallin S. Durfee

doi:10.1364/LS.2010.LWB3

Frontiers in Optics 2010/Laser Science XXVI
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper LWB3
•https://doi.org/10.1364/LS.2010.LWB3

Precision Metrology with a Strontium Ion Interferometer

Christopher J. Erickson, James L. Archibald, Mary Lyon, and Dallin S. Durfee

Laser Science 2010

Rochester, New York United States
24–28 October 2010
ISBN:

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Metrology and Precision Measurements I (LWB)

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C. J. Erickson, J. L. Archibald, M. Lyon, and D. S. Durfee, "Precision Metrology with a Strontium Ion Interferometer," in Frontiers in Optics 2010/Laser Science XXVI, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper LWB3.

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Abstract

We present a strontium ion interferometer for use as an electromagnetic field sensor with unprecedented sensitivity. Applications include measurements of fringing fields, studies of image charge scattering in superconductors, and ultra-precise tests of electromagnetism.

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