Resolution Enhancement in Two-photon Microscopy by Applying Structured Line Illumination

Chi-Deng Lin; Chia-Hua Yeh; Szu-Yu Chen

doi:10.1364/FIO.2014.JW3A.17

Frontiers in Optics 2014
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper JW3A.17
•https://doi.org/10.1364/FIO.2014.JW3A.17

Resolution Enhancement in Two-photon Microscopy by Applying Structured Line Illumination

Chi-Deng Lin, Chia-Hua Yeh, and Szu-Yu Chen

Laser Science 2014

Tucson, Arizona United States
19–23 October 2014
ISBN: 1-55752-286-3

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Joint Poster Session II (JW3A)

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C. Lin, C. Yeh, and S. Chen, "Resolution Enhancement in Two-photon Microscopy by Applying Structured Line Illumination," in Frontiers in Optics 2014, OSA Technical Digest (online) (Optica Publishing Group, 2014), paper JW3A.17.

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Abstract

To enhance the resolution of two-photon microscopy, structured illumination was applied with a line scanning geometry. Using the square proportionality between two-photon emission and excitation intensity, a ~3-fold resolution improvement was shown in the results.

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