Frequency Analysis for 3D Localization-based Optical Microscopy

Bryce Schroeder; Bryce Schroeder; Shu Jia

doi:10.1364/FIO.2015.JTu4A.83

Frontiers in Optics 2015
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper JTu4A.83
•https://doi.org/10.1364/FIO.2015.JTu4A.83

Frequency Analysis for 3D Localization-based Optical Microscopy

Bryce Schroeder and Shu Jia

Laser Science 2015

San Jose, California United States
18–22 October 2015
ISBN: 978-1-943580-03-3

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Poster Session - Tuesday (JTu4A)

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B. Schroeder and S. Jia, "Frequency Analysis for 3D Localization-based Optical Microscopy," in Frontiers in Optics 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JTu4A.83.

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Abstract

We conducted a comprehensive frequency-domain analysis of a recently-reported self-bending point spread function (SB-PSF) and compared it with Gaussian and astigmatic PSFs, quantifying its advantages for 3D localization-based optical microscopy.

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