Soft-x-ray transient absorption spectroscopy of sulfur hexaflouride in strong SWIR fields

Patrick Rupprecht; Lennart Aufleger; Alexander Magunia; Simon Heinze; Thomas Ding; Marc Rebholz; Stefano Amberg; Nikola Mollov; Felix Henrich; Maurits Haverkort; Christian Ott; Thomas Pfeifer

doi:10.1364/FIO.2020.JTh4A.8

Frontiers in Optics / Laser Science
OSA Technical Digest (Optica Publishing Group, 2020),
paper JTh4A.8
•https://doi.org/10.1364/FIO.2020.JTh4A.8

Soft-x-ray transient absorption spectroscopy of sulfur hexaflouride in strong SWIR fields

Patrick Rupprecht, Lennart Aufleger, Alexander Magunia, Simon Heinze, Thomas Ding, Marc Rebholz, Stefano Amberg, Nikola Mollov, Felix Henrich, Maurits Haverkort, Christian Ott, and Thomas Pfeifer

Laser Science 2020

Washington, DC United States
14–17 September 2020
ISBN: 978-1-943580-80-4

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Joint Poster Session IVA (JTh4A)

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P. Rupprecht, L. Aufleger, A. Magunia, S. Heinze, T. Ding, M. Rebholz, S. Amberg, N. Mollov, F. Henrich, M. Haverkort, C. Ott, and T. Pfeifer, "Soft-x-ray transient absorption spectroscopy of sulfur hexaflouride in strong SWIR fields," in Frontiers in Optics / Laser Science, B. Lee, C. Mazzali, K. Corwin, and R. Jason Jones, eds., OSA Technical Digest (Optica Publishing Group, 2020), paper JTh4A.8.

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Abstract

We report on experimental soft-x-ray transient absorption spectroscopy in SF₆. The influences of strong SWIR fields and of vibrational dynamics initiated by impulsive stimulated Raman scattering on the $6 a_{1 g} {(S 2 p_{1 / 2, 3 / 2})}^{- 1}$ resonance are investigated.

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